for monitoring carrier lifetime and diffusion length in monocrystalline and polycrystalline silicon wafers and amorphous silicon film, especially in solar cells made by above material.

HS-L1 Minority Carrier Lifetime Tester provide undamaged, uncontested high resolution measurement techniques for monitoring carrier lifetime and diffusion length in monocrystalline and polycrystalline silicon wafers and amorphous silicon film, especially in solar cells made by above material. The measuring sample size can be up to 500mm in diameter. The analyzer is designed based on Microwave Photoconductive Decay (u-PCD) technology.